Research and Development / Quality Control / Failure Analysis
Optoelectronic Characterization System (Optronix Spectrometer, Advantest R6243)
Semiconductor DC Parametric System (Advantest R6243, R6244, R6245 and R6246)
Semiconductor Analysis Software for Agilent 4145, 4155 Instruments
Transceiver Test Station (Aeroflex Radio Test Set, Thomson Radio)
Automated In-Circuit Component Analyzer
Production Tester and Manufacturing
High Speed Parametric Tester (Keithley 2400, 2612 and National Instruments 4110, 4130)
Focus Controller Test Station (Advantest R6851)
LCD Inspection System
PCB Diagnostic System
Battery Formation/Cycler System
High Speed Production Control system
Signal Conditioning and data Acquisition
Temperature Measurement System
Flow and Temperature System
Energy Management System
Telecommunication
Multi-port SDH Monitoring System